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DfR Solutions utilizes Auger Electron Spectroscopy (AES) and (Scanning Auger) Microscopy to perform elemental analysis.

To perform this analysis, a tightly focused electron beam is fired at the sample surface resulting in the emission of Auger electrons. Each element emits Auger electrons at unique intensities and frequencies. Elemental maps, showing the distribution of each element present within the area of interest, are then produced from the detection of the scattered Auger electrons.

If you would like more information on AES, please send us an email.