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About the Automotive Electronics Council

The AEC was established to standardize quality requirements for electronic component suppliers to the automotive industry. While the test requirements spelled out by the AEC are very similar to JEDEC (e.g., compare JESD22-B116 with Q100-001 and JESD22-A115A with Q100-003), there are two key differences. The first is that because components can be certified to AEC specifications, a specific set of test parameters and pass/fail criteria are often detailed. Second, AEC provides test requirements not only for integrated circuits (Q100), but also for discrete (Q101) and passive (Q200) components.

A list of AEC standards is provided below. Because registration is required to access these documents, links are not provided here. However, if you have any questions or concerns with these requirements, please feel free to contact us at askdfr@dfrsolutions.com.

Standards

Q100 Rev — G base: Stress Qualification for Integrated Circuits

• Q100-001C: Wire Bond Shear Test.
• Q100-002D: Human Body Model (HBM) Electrostatic Discharge Test.
• Q100-003E: Machine Model (MM) Electrostatic Discharge Test.
• Q100-004C: IC Latch-Up Test.
• Q100-005B: Non-Volatile Memory Program/Erase Endurance, Data Retention, and Operational Life Test.
• Q100-006D: Electro-Thermally Induced Parasitic Gate Leakage Test (GL).
• Q100-007A: Fault Simulation and Test Grading.
• Q100-008A: Early Life Failure Rate (ELFR).
• Q100-009A: Electrical Distribution Assessment.
• Q100-010A: Solder Ball Shear Test.
• Q100-011B: Charged Device Model (CDM) Electrostatic Discharge Test.
• Q100-012: Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems.

Q101 Rev — C: Stress Test Qualification for Discrete Semiconductors

• Q101-001A: Human Body Model (HBM) Electrostatic Discharge Test.
• Q101-002A: Machine Model (MM) Electrostatic Discharge Test.
• Q101-003A: Wire Bond Shear Test.
• Q101-004: Miscellaneous Test Methods.
• Q101-005A: Charged Device Model (CDM) Electrostatic Discharge Test.
• Q101-006: Short Circuit Reliability Characterization of Smart Power Devices for 12V Systems.

Q200 Rev — C: Stress Test Qualification for Passive Components

• Q200-001A: Flame Retardance Test.
• Q200-002A: Human Body Model (HBM) Electrostatic Discharge Test.
• Q200-003A: Beam Load (Break Strength) Test.
• Q200-004: Measurement Procedures for Resettable Fuses.
• Q200-005: Board Flex/Terminal Bond Strength Test.
• Q200-006: Terminal Strength (SMD)/Shear Stress Test.
• Q200-007: Voltage Surge Test.

For more information on DfR’s AEC testing capabilities, call us at 301-474-0607, or send us an email.