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Course Archive
A List of Courses That DfR Solutions Has Given:
For more information, or to schedule a seminar on-site at your location, call us at 301-474-0607, or send us an email.
2010
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Next Generation Technologies in Electronic Packaging and Production
Nistec Seminar, Herzliya, Israel
July 2010 |
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Design for Reliability
Nistec Seminar, Herzliya, Israel
July 2010 |
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Counterfeit Prevention & Detection Strategies: Cost vs Risk Assessment
SMTA Symposium on Counterfeit Electronic Parts (West), Phoenix, AZ
June 2010 |
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Manufacturing and Reliability Challenges with QFN
iMAPS Mid-Atlantic Conference, Atlantic City, NJ
June 2010 |
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Common Hardware Mistakes by Embedded Systems Designers
Embedded Systems Conference - Midwest, Chicago, IL
June 2010 |
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Contamination and Cleanliness: Developing Practical Responses to a Challenging Problem
iMAPS Nordic, Goteborg, Sweden
June 2010 |
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True Design for Reliability
SMTA Pb-Free Academy, Toronto, Canada
May 2010 |
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Reality of Pb-Free Reliability
SMTA Pb-Free Academy, Toronto, Canada
May 2010 |
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Advanced: Common Hardware Mistakes by Embedded System Designers
Embedded Systems Conference Silicon Valley, San Jose, CA
April 2010 |
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Introductory: Common Hardware Mistakes by Embedded System Designers
Embedded Systems Conference Silicon Valley, San Jose, CA
April 2010 |
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The Introduction of Tensile Ratcheting in Solder Bumps Encapsulated in Low Tg Underfill
iMAPS Device Packaging Conference, Phoenix, AZ
March 2010 |
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Selection of a Surface Finish
SMTA Chapter Meeting, Minneapolis, MN
February 2010 |
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Ensuring and Predicting the Reliability of Concentrated Photovoltaics (CPV): Interconnect Structures
Photovoltaic Module Reliability Workshop, Golden, CO
February 2010 |
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Manufacturing and Reliability Challenges with QFN
iMAPS Chesapeake, Laurel, Maryland
January 2010 |
2009
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Manufacturing and Reliability Challenges with QFN
Central Texas Electronics Association, Austin, Texas
October 2009 |
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Failure Analysis in Electronics: An Overview
SMQ Laboratories, Shenzhen, China
June 2009 |
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Manufacturing and Reliability Challenges with QFN
SMTA/iMAPS, Boston, MA
April 2009 |
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How I Learned to Stop Worrying and Design Reliability In
IEEE Reliability Society, Dallas, TX
March 2009 |
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Next Generation Technologies in Electronic Packaging and Production
IPC APEX Expo, Las Vegas, NV
March 2009 |
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Design for Reliability: A Physics of Failure Based Approach
IPC APEX Expo, Las Vegas, NV
March 2009 |
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The Reality of Pb-free Reliability
IPC APEX Expo, Las Vegas, NV
March 2009 |
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Manufacturing and Reliability Challenges with QFN
SMTA DC Chapter, Ashburn, VA
February 2009 |
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Understanding Failure and Root-Cause Analysis in Electronics
SMTA Academy, Anaheim, CA
February 2009 |
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Pb-Free & Medical Applications
SMTA Academy, Anaheim, CA
February 2009 |
2008
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The Fatigue Behavior of Pb-Free Solder
SMTA Long Island Academy, Long Island, NY
October 2008 |
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The Reality of Pb-Free Reliability
SMTA Nutmeg, Southbury, CT
October 2008 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
IPC Midwest, Chicago, IL
September 2008 |
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Next Generation Technologies in Electronic Packaging and Production
IPC Midwest, Chicago, IL
September 2008 |
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The Affects of REACH on the Electronics Industry
SMTA Capitol Chapter Vendor Day, Laurel, MD
September 2008 |
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Next Generation Technologies
SMTA International, Orlando, FL
August 2008 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
SMTA International, Orlando, FL
August 2008 |
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Understanding the Motivation and Basics of Root-Cause Analysis
Webcast
July 2008 |
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The Reality of Pb-Free Reliability
SMTA International, Toronto, Canada
May 2008 |
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Common Hardware Mistakes by Embedded System Designers
Embedded Systems Conference, San Jose, CA
April 2008 |
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True Design for Reliability: Understanding What Is and What Is Not DfR
IPC Printed Circuits Expo/APEX, Las Vegas, NV
March 2008 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
IPC Printed Circuits Expo/APEX, Las Vegas, NV
March 2008 |
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Robustness of Printed Wiring Boards to Pb-free Reflow and the Influence of Absorbed Moisture
SMTA International, Webcast
March 2008 |
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The Paradigm Shift in Design Assurance and Reliability Prediction
Commercialization of Military and Space Electronics, San Diego, CA
February 2008 |
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How to Develop a Qualification Test Plan for RoHS Products
Reliability and Maintainability Symposium, Las Vegas, NV
January 2008 |
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Developing a Pb-Free Qualification Plan for Hi-Rel Applications
LEAP Working Group, Irving, TX
January 2008 |
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Selecting a Pb-Free Solution for Military, Avionic, and Space Applications
SMTA Anaheim Academy, Anaheim, CA
January 2008 |
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A Perspective on the Reliability of MEMS for Telecommunications
Photonics West, San Jose, CA
January 2008 |
2007
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Specifying Printed Cicuit Boards
Florham Park, NJ
November 2007 |
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Selecting a Pb-Free Solution for Military, Avionic, and Space Applications
SMTA International, Orlando, FL
November 2007 |
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Selecting a Pb-Free Solution for Military, Avionic, and Space Applications
SMTA International, Orlando, FL
October 2007 |
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Best Practices in Failure Avoidance
PTI, San Jose, CA
October 2007 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
San Francisco, CA
October 2007 |
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Ensuring Quality and Reliability in Printed Circuit Boards
Boston, MA
September 2007 |
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Best Practices in Failure Avoidance
SEMICON West, San Francisco, CA
July 2007 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
SEMICON West, San Francisco, CA
July 2007 |
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Design for Manufacturability/Assembly
Asian Convergence for Electronics, Kuala Lumpur, Malaysia
June 2007 |
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Pb-Free Interconnection: Technology and Connection
Asian Convergence for Electronics, Kuala Lumpur, Malaysia
June 2007 |
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Selecting a Pb-Free Solution for Military, Avionic, and Space Applications
AIMS Harch Electronics Workshop, Indianapolis, IN
June 2007 |
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Failure and Root-Cause Analysis in Medical Electronics
SMTA Medical Electronics Symposium, Bloomington, MN
May 2007 |
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Reality of Pb-Free Reliability
SMTA International, Toronto, Canada,
April 2007 |
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Best Practices of Failure Analysis
Milpitas, CA
March 2007 |
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Selecting a Pb-Free Solution for Military, Avionic and Space Applications
Commercialization of Military and Space Electronics, Los Angeles, CA
March 2007 |
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Controlling and Qualifying Pb-free Components
Anaheim, CA
February 2007 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
IPC Printed Circuits Expo, Los Angeles, CA
February 2007 |
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Risk Minimization for Pb-Free Design in Telecommunication Products
North American Regulatory Conference for Electronics Products, Shenzhen, China
January 2007 |
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Failure Analysis for Electronics
North American Regulatory Conference for Electronics Products, Shenzhen, China
January 2007 |
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Simplified Failure Model for Pb-Free Solder
LEAP Florida, Coral Gables, Florida
January 2007 |
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Whisker-Resistant Plating Usage by Major Semiconductor Manufacturers
LEAP Florida, Coral Gables, Florida
January 2007 |
2006
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
IPC/JEDEC International Conference on Lead-free Electronics, Boston, MA
December 2006 |
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Pb-Free Solder Reliability
TMS/SMTA, Webcast
November 2006K |
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Root-Cause Analysis in Electronics
Burlington, Canada
November 2006 |
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How to be Compliant with the New GEIA/IEC Specifications for Pb-Free Products in Military Applications
DMC, Nashville, TN
November 2006 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
IPC/JEDEC International Conference on Pb-Free Electronics, Frankfurt, Germany
November 2006 |
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Reality of Pb-Free Reliability
DfR Solutions, Webcast
October 2006 |
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Understanding Failure and Root-Cause Analysis in Pb-Free Electronics
IPC/JEDEC International Conference on Pb-Free Electronics, Singapore
October 2006 |
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Integrating Advanced QRD (Quality, Reliability, Durability) Tactics with Accelerated Product Development
Accelerated Reliability Technology Symposium (ARTS), New York, NY
September 2006 |
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Reality of Pb-Free Reliability
Surface Mount Technology Association International, Chicago, IL
September 2006 |
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The Comprehensive Guide to Uprating in Electronic Components
Shenzhen, China
July 2006 |
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Performance of Pb-Free Materials in Electronics
Components for Military & Space Electronics (CMSE), Portsmouth, UK
June 2006 |
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Reliability Assurance in Medical Electronics
SMTA Medical Electronics, Minneapolis, MN
May 2006 |
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The Reality of Pb-Free Reliability
NEPCON East, Boston, MA
May 2006 |
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Pb-Free Reliability
Del Mar Electronics Show: Race to RoHS, San Diego, CA
April 2006 |
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Integrating Advanced QRD Tactics with Accelerated Product Development
HALT/HASS Workshop DfR Solutions, College Park, MD
April 2006 |
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HALT/HASS and Best Practices in Reliability
HALT/HASS Workshop DfR Solutions, College Park, MD
April 2006 |
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Pb-Free and Related Concerns
Society of Reliability Engineers (Washington Chapter), Washington, DC
March 2006 |
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Failure Avoidance in Military and Space Electronics
Components for Military & Space Electronics Conference (CMSE), Los Angeles, CA
February 2006 |
2005 and Prior
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Red Phosphorus, Bulging Capacitors: What Went Wrong with the Supply Chain and Why It Will Happen Again
DfR Solutions, Webcast
November 2005 |
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Understanding RoHS/WEEE Requirements
Manufacturing and Economic Recovery Conference (MERC), Chicago, IL
October 2005 |
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Best Practices in Reliability
MIT/Industry Consortium on Advanced Automotive Electrical/Electronic Components and Systems, Boston, MA
2005 |
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Understanding the Role of Root-Cause Analysis in the HALT Process
Boston, MA
October 2005 |
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Reality of Pb-Free Reliability
SMTA International, Chicago, IL
September 2005 |
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Reality of Pb-Free Reliability
SMTA, Webcast
July 2005 |
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Electrochemical Migration Mechanisms in Electronics
Shenzhen, China
June 2005 |
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Reality of Pb-Free Reliability
IEEE Reliability Society, Boston, MA
May 2005 |
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Reality of Pb-free Reliability
Boston, MA
May 2005 |
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Design for Reliability
ITLAM, Herzila, Israel
March 2005 |
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Reality of Pb-Free Reliability
ITLAM, Herzila, Israel
March 2005 |
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Failures at the Customer and the Influence of Pb-Free
IEEE Components, Packaging, and Manufacturing Technology Society, Santa Clara, CA
October 2004 |
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Design for Reliability
Gumi Institute of Electronic Technology, Gumi, Korea
October 2004 |
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Printed Circuit Board Failure Mechanisms
Windsor, CT
June 2003 |
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Pb-Free Soldering Technology
ILTAM, Herzlia, Israel
January 2002 |
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