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Scanning Electron Microscopy (SEM)About SEM and EDXIf higher magnification is necessary, samples may be imaged with Scanning Electron Microscopy (SEM). Scanning electron microscopy (SEM) allows for a clear, topological view of microscopic surfaces. Electron microscopy measures the angle and energy of reflected electrons rastered across the surface of a sample to create an image. Energy Dispersive X-ray spectroscopy (EDX or EDS) is an accompanying technology that uses these energy readings to determine elemental composition of the sample. For more information, or if you have a specific question regarding SEM or EDX, please send us an email. |