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Focused Ion Beam (FIB) microscopy and processing is another technology available to DfR Solutions customers. FIB allows nanometer resolution imaging and cross sectioning of complex structures. The combination of FIB micro-machining and TEM imaging makes it possible to detect and identify sub-micrometer defects in a sample.

Focused Ion Beam technology is similar to traditional Scanning Electron Beam (SEM) in that a beam of charged particles is swept across a sample and used to image it. The two processes differ in that the mass and energy are much higher with FIB. FIB is much higher resolution and has the capability to sputter, or mechanically blast away, atoms off the target sample. Using this process, it is possible to drill down to an area of interest or take a cross section at a precisely determined location.

If you would like more information regarding Focused Ion Beam Microscopy, please contact us at 301-474-0707, or send us an email.