DfR has developed a unique solution for qualification and failure analysis of film capacitors.  With a traditional testing method, controllers are monitored over a period of time to observe capacitance levels. Our Partial Discharge Detection Circuit (patent-pending) is used to characterize the partial discharge behavior of film capacitors by measuring partial discharge initiation voltage (PDIV).  This testing method is much more relevant and comprehensive as it is able to measure the self-healing mechanism found in film capacitors and quantitatively assess its behavior. An example of the value of this capability would be in benchmarking two or three suppliers and comparing the magnitude and distribution of PDIV among multiple samples from each supplier.