DfR Solutions Reliability Designed and Delivered

The expert engineers and reliability professionals at DfR Solutions are thought leaders in electronics reliability. We’ve compiled a wide-range knowledge base of topics on testing. Click a category below to access whitepapers, webinars and more. 


Testing

A Change In Paradigm: Maximum Tin Whisker Lengths Just Got Longer
A New Method for Testing Electrolytic Capacitors to Compare Life Expectancy
Accelerated Aluminum Electrolytic Capacitor Life Testing
Best Practices in Avoiding Pad Cratering and Capacitor Cracking
Best Practices in Thermal Derating
Beyond Bearing Wearout: Why Current Testing Of Fans Is Insufficient And Understanding DfR’s Solution
Capturing The Robustness Of Glass Panels In Touch-Screen Displays
Component Packaging Testing Services
Contamination and Cleanliness: Developing Practical Responses to a Challenging Problem
Counterfeit Detection Strategies: When And How To Do It
Counterfeit Testing Methodology: Minimizing Costs While Minimizing Risks
Creep Corrosion Of Electronic Assemblies In Harsh Environments
Crossing the Chasm from ECAD to CAE
Electrostatic Discharge (ESD): A Potentially Dominant Failure Mechanism
Ensuring Suitability Of Cu Wire Bonded ICs For Automotive Applications
Extreme Drop Testing
Failure Analysis in Electronics
Get the Lead Out
Guarantee Reliability with Mechanical Shock Simulation
Heatsink Optimization
Hollow Fiber Measurement Technique
Ion Chromatography
Leave No Technology Behind
Let It Flow
No MTBF Do You Know MTBF?
Opto-Electronics: The Secret To Success
Overview of Copper Pillar Technology
Part Quality: How To Test, When To Test, And What Does It All Mean? DfR Solutions Open House
Physics of Failure Simulation and Modeling Specifications
Preventing Pad Cratering During ICT
Product Reliability Alert: Red Phosphorous
Projection Lamp Failure Analysis
Qualifying For Moisture Containing Environments
Quantitatively Analyzing The Performance Of Integrated Circuits And Their Reliability
Reballing Process Controls and Cleanliness
Root Cause Analysis of HALT Failures
Slow Body Diode Failures Of Field Effect Transistors (FETs)
Solder Attachment Reliability
Solving Problems of Overly Constrained Boards
SQUID-Superconducting Quantum Interference Device Update
Surviving the Heat Wave: Thermally Induced Failures and Reliability Risks Created by Advancements in Electronics Technologies
Telecommunications ESD Audit
Test Plan Development
Test Plan Development: How to Do It
The Secret to Low Cost, High Reliability Power Supplies
Understanding The Criticality Of Stencil Aperture Design And Implementation For A QFN Package
Vehicle Prognostics
Vehicle Prognostics To Enable Optimized Maintenance And Logistics
You Can Not Pass Or Fail HALT


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