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DfR Solutions Reliability Designed and Delivered

IEEE Santa Clara Valley Reliability Chapter Meeting

Location: SANTA CLARA, CA

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On Thursday, February 9, DfR Solutions' CEO and Managing Parter Craig Hillman will be the featured speaker at the February IEEE Santa Clara Valley Reliability Chapter Meeting. The meeting will be held from 6:30-8:00 PM at Qualcomm in Santa Clara, CA. Dr. Hillman will be presenting on, "Copper Pillar, ELK, and Solder: The Challenges of Assembly and Long-Term Reliability at 28nm and 16nm."  

Manufacturing and performance take the forefront in regards to semiconductor packaging. The introduction of copper pillar has helped increase the number of I/O’s and current density. The increasing use of extra low-k (ELK) and ultra low-k (ULK) material, especially at higher metal layers, has allowed for lower RC constants and better performance. However, both of these changes can come at a cost. A number of companies are reporting challenges with these new structures, especially at 28nm and 16nm process nodes. Dr. Hillman’s presentation will review the current status of copper pillar and ELK, the potential risks both introduce into assembly and long-term reliability, and avenues to evaluate and mitigate any life-limiting mechanisms.

Dr. Hillman is an expert in the development and implementation of strategic reliability processes and operations. He is the CEO and Managing Partner of DfR Solutions, a leader in quality, reliability, and durability (QRD) solutions for the electronics industry. He has led the company through tremendous growth, making it one of the most highly regarded reliability organizations in the international electronics marketplace.

About IEEE Santa Clara Valley Reliability Chapter:
The IEEE Reliability Society is concerned with strategies and best practices for attaining, assessing, assuring, and sustaining system reliability throughout its life cycle. It provides a professional home for engineering communities or disciplines in these focus areas. This chapter serves members in Santa Clara Valley, CA.

This meeting is open to all members of the IEEE Santa Clara Valley Reliability Chapter for free. 

For more details on this event, click here

Topics: 2017