// Central Randomizer:

rnd.today=new Date();
rnd.seed=rnd.today.getTime();

function rnd() {
	rnd.seed = (rnd.seed*9301+49297) % 233280;
	return rnd.seed/(233280.0);
	};

function rand(number) {
	return Math.ceil(rnd()*number);
	};

// end central randomizer


// Start items to be randomized -- Articles, White Papers, Case Studies...

// A - Articles (57: = 4 groups of 12 plus 1 group of 9):
function articlesgroup1() {
	var number = rand(12);
	if (number == 1) return('<a href\=\"uploads/publications\/2005_SMTA_Paper_2007.pdf\"\>A Comparison of the Isothermal Fatigue Behavior of SnAgCu to SnPb Solder\<\/a\>');
	if (number == 2) return('<a href\=\"uploads/publications\/2002_Diffusion_Hillman-Ardebili.pdf\"\>A Comparison of the Theory of Moisture Diffusion in Plastic Encapsulated Microelectronics with Moisture Sensor Chip and Weight-gain Measurements\<\/a\>');
	if (number == 3) return('<a href\=\"uploads/publications\/2001_VQ_Hillman-Cunningham.pdf\"\>A Demonstration of Virtual Qualification for the Design of Electronic Hardware\<\/a\>');
	if (number == 4) return('<a href\=\"uploads/publications\/2004_SQUID_Hillman.pdf\"\>A Novel Approach to Identifying and Validating Electrical Leakage in Printed Circuit Boards through Magnetic Current Imaging\<\/a\>');
	if (number == 5) return('<a href\=\"uploads/publications\/2006_ASTR_Presentation.pdf\"\>Accelerated Testing of Surface Mount Solder Joints Using Printed Wiring Board Power Cycling\<\/a\>');
	if (number == 6) return('<a href\=\"uploads/publications\/2006_Blattau_IPC_working.pdf\"\>An Engelmaier Model for Leadless Ceramic Chip Devices with Pb-free Solder\<\/a\>');
	if (number == 7) return('<a href\=\"uploads/publications\/2004_PSAAdhesion_Hillman-Rodgers.pdf\"\>An Experimental Investigation into the Creep Behavior of Pressure Sensitive Adhesive Tapes for Air-cooled Component-Heat Sink Assemblies\<\/a\>');
	if (number == 8) return('<a href\=\"uploads/publications\/2003_Stresses.pdf\"\>An Investigation of the Contact Resistance of a Commercial Elastomer Interconnect under Thermal and Mechanical Stresses\<\/a\>');
	if (number == 9) return('<a href\=\"uploads/publications\/2003_3D_Measurement_System.pdf\"\>Application of 3D Measurement System with CCD Camera in Microelectronics\<\/a\>');
	if (number == 10) return('<a href\=\"uploads/publications\/2000_LandGridArray_Hillman-Xie.pdf\"\>Assessing the Operating Reliability of LGA Elastomer Sockets\<\/a\>');
	if (number == 11) return('<a href\=\"uploads/publications\/2005_PhaseGrowth_Hillman-Kleyner.pdf\"\>Assessment of Eutectic Solder Phase Growth in Under-the-hood Power Control Modules\<\/a\>');
	if (number == 12) return('<a href\=\"uploads/publications\/2002_JApplPhys_AuSi.pdf\"\>Calorimetric Investigation of the Formation of Metastable Silicides in Au\/a-Si Thin-film Multilayers\<\/a\>');
	}

function articlesgroup2() {
	var number = rand(12);
	if (number == 1) return('<a href\=\"uploads/publications\/2002_Relaxation.pdf\"\>Characteristics of Stress Relaxation in Encapsulated Molding Compounds\<\/a\>');
	if (number == 2) return('<a href\=\"uploads/publications\/2003_Potting_Hillman-Baylakoglu.pdf\"\>Characterization of Some Commercial Thermally-cured Potting Materials\<\/a\>');
	if (number == 3) return('<a href\=\"uploads/publications\/2006_Blattau_IPC.pdf\"\>Comparison of the Isothermal Fatigue Behavior of Sn-Ag-Cu to Sn-Pb\<\/a\>');
	if (number == 4) return('<a href\=\"uploads/publications\/1999_CFF_Hillman-Nachbor.pdf\"\>Conductive Filament Formation Failure in a Printed Circuit Board\<\/a\>');
	if (number == 5) return('<a href\=\"uploads/publications\/1999_CFF_Hillman-Jennings.pdf\"\>Conductive Filament Formation: A Potential Reliability Issue in Laminated Printed Circuit Cards with Hollow Fibers\<\/a\>');
	if (number == 6) return('<a href\=\"uploads/publications\/2006_DesignCeramCapSAC.pdf\"\>Design Guidelines for Ceramic Capacitors Attached with SAC Solder\<\/a\>');
	if (number == 7) return('<a href\=\"uploads/publications\/2003_FlexCrack_Hillman-Blattau.pdf\"\>Design Guidelines for Preventing Flex Cracking Failures in Ceramic Capacitors\<\/a\>');
	if (number == 8) return('<a href\=\"uploads/publications\/2003_ICA_Hillman-Helmold.pdf\"\>Determining the Lifetime of Silver-filled Isotropic Conductive Adhesive (ICA)\/Solder-plated Interconnections\<\/a\>');
	if (number == 9) return('<a href\=\"uploads/publications\/2002_MFGEncapsulants_Hillman-Castillo.pdf\"\>Diffusion and Absorption of Corrosive Gases in Electronic Encapsulants\<\/a\>');
	if (number == 10) return('<a href\=\"uploads/publications\/1999_HollowFiber_Hillman-Driessche.pdf\"\>Do You Know That Your Laminates May Contain Hollow Fibers\?\<\/a\>');
	if (number == 11) return('<a href\=\"uploads/publications\/2002_Plating_Hillman-McCluskey.pdf\"\>Effect of PWB Plating on the Microstructure and Reliability of SnAgCu Solder Joints\<\/a\>');
	if (number == 12) return('<a href\=\"uploads/publications\/2005_Conformal_Coating.pdf\"\>Effects of Conformal Coating on Solder Spreading Phenomenon\<\/a\>');
	}

function articlesgroup3() {
	var number = rand(12);
	if (number == 1) return('<a href\=\"uploads/publications\/2004_ECM_Hillman-Bumiller.pdf\"\>Electrochemical Migration on HASL Plated FR-4 Printed Circuit Boards\<\/a\>');
	if (number == 2) return('<a href\=\"uploads/publications\/2005_AgingPolyimide_Hillman-Murray.pdf\"\>Environmental Aging and Deadhesion of Polyimide Dielectric Films\<\/a\>');
	if (number == 3) return('<a href\=\"uploads/publications\/2003_AgingAdhesive_Hillman-Murray.pdf\"\>Environmental Aging and Deadhesion of Siloxane-Polyimide-Epoxy Adhesive\<\/a\>');
	if (number == 4) return('<a href\=\"uploads/publications\/2006_Epidemiological_Study_Pb-free_Solder.pdf\"\>Epidemiological Study on Sn-Ag-Cu Solder: Benchmarking Results From Accelerated Life Testing\<\/a\>');
	if (number == 5) return('<a href\=\"uploads/publications\/2003_Mmic.pdf\"\>Failure Analysis of Electrostatic Discharge and Electrical Overstress Failures of GaAs MMIC\<\/a\>');
	if (number == 6) return('<a href\=\"uploads/publications\/2004_HighAltitude_Hillman-Blattau.pdf\"\>Failure Mechanisms in Electronic Products at High Altitudes\<\/a\>');
	if (number == 7) return('<a href\=\"uploads/publications\/2005_MAE_LED_article.pdf\"\>Failure Mechanisms in LED and Laser Diodes\<\/a\>');
	if (number == 8) return('<a href\=\"uploads/publications\/2003_BMECapacitors_Hillman-Donahoe.pdf\"\>Failures in Base Metal Electrode (BME) Capacitors\<\/a\>');
	if (number == 9) return('<a href\=\"uploads/publications\/1997_Finite_Element_Modeling.pdf\"\>Finite Element Modeling of Printed Circuit Boards for Structural Analysis\<\/a\>');
	if (number == 10) return('<a href\=\"uploads/publications\/1998_Terminology_Hillman-Katz.pdf\"\>Getting the Quality and Reliability Terminology Straight\<\/a\>');
	if (number == 11) return('<a href\=\"uploads/publications\/2003_IEEE_IM_in_SAC.pdf\"\>Growth and Selection of Intermetallic Species in Sn-Ag-Cu No-Pb Solder Systems based on Pad Metallurgies and Thermal Histories\<\/a\>');
	if (number == 12) return('<a href\=\"uploads/publications\/2004_FlexCrackPb-Free1_Hillman-Blattau.pdf\"\>Has the Electronics Industry Missed the Boat on Pb-free\? Failures in Ceramic Capacitors with Pb-free Solder Interconnects\<\/a\>');
	}

function articlesgroup4() {
	var number = rand(12);
	if (number == 1) return('<a href\=\"uploads/publications\/2001_HollowFibers_Hillman-Rogers.pdf\"\>Hollow Fibers Can Accelerate Conductive Filament Formation\<\/a\>');
	if (number == 2) return('<a href\=\"uploads/publications\/2004_Electrolyte_Hillman-Helmold.pdf\"\>Identification of Missing or Insufficient Electrolyte Constituents in Failed Aluminum Electrolytic Capacitors\<\/a\>');
	if (number == 3) return('<a href\=\"uploads/publications\/2004_PCBRootCause_Hillman.pdf\"\>Improved Methodologies for Identifying Root Cause of Printed Board Failures\<\/a\>');
	if (number == 4) return('<a href\=\"uploads/publications\/2002_Intermetallic_Hillman-McCluskey.pdf\"\>Intermetallic Growth on PWBs Soldered with Sn\<span class\=\"sub\"\>3.8\<\/span\>Ag\<span class\=\"sub\"\>0.7\<\/span\>Cu\<\/a\>');
	if (number == 5) return('<a href\=\"uploads/publications\/2006_Pb-free_Reliability_MilitaryAvionics.pdf\"\>Lead Free: Predicting and Ensuring Reliability in Military Avionics\<\/a\>');
	if (number == 6) return('<a href\=\"uploads/publications\/2004_FlexCrackPb-Free2_Hillman-Blattau.pdf\"\>Lead-free Solder and Flex Cracking Failures in Ceramic Capacitors\<\/a\>');
	if (number == 7) return('<a href\=\"uploads/publications\/2004_CTE_AuSn4.pdf\"\>Linear Coefficients of Thermal Expansion of Au\<span class\=\"sub\"\>0.5\<\/span\>Ni\<span class\=\"sub\"\>0.5\<\/span\>Sn\<span class\=\"sub\"\>4\<\/span\>, Au\<span class\=\"sub\"\>0.75\<\/span\>Ni\<span class\=\"sub\"\>0.25\<\/span\>Sn\<span class\=\"sub\"\>4\<\/span\>, and AuSn\<span class\=\"sub\"\>4\<\/span\>\<\/a\>');
	if (number == 8) return('<a href\=\"uploads/publications\/2005_IEEE_Microstructure_in_SAC.pdf\"\>Microstructure and Damage Evolution in Sn-Ag-Cu Solder Joints\<\/a\>');
	if (number == 9) return('<a href\=\"uploads/publications\/2004_Pressure_Sensitive_Adhesive.pdf\"\>Reliability of Pressure-sensitive Adhesive Tapes for Heat Sink Attachment in Air-cooled Electronic Assemblies\<\/a\>');
	if (number == 10) return('<a href\=\"uploads/publications\/2005_PCI_Article.pdf\"\>Robustness of Surface Mount Aluminum Electrolytic Capacitors When Subjected to Pb-free Reflow\<\/a\>');
	if (number == 11) return('<a href\=\"uploads/publications\/2006_Cracking_Pb-free.pdf\"\>Robustness of Surface Mount Multilayer Ceramic Capacitors Assembled with Pb-free Solder\<\/a\>');
	if (number == 12) return('<a href\=\"uploads/publications\/2004_Simulation.pdf\"\>Simulation Model Development for FBGA Solder Joint Reliability\<\/a\>');
	}

function articlesgroup5() {
	var number = rand(9);
	if (number == 1) return('<a href\=\"uploads/publications\/1999_SingleSided_Hillman-Laurence.pdf\"\>Solder Failure Mechanisms in Single-sided Insertion-mount Printed Wiring Boards\<\/a\>');
	if (number == 2) return('<a href\=\"uploads/publications\/1999_IEEE_Solder_Metalization.pdf\"\>Solder Metalization Interdiffusion in Microelectronic Interconnects\<\/a\>');
	if (number == 3) return('<a href\=\"uploads/publications\/1995_Surface_Cracking_Under_Stress.pdf\"\>Surface Cracking in Layers Under Biaxial, Residual, Compressive Stress\<\/a\>');
	if (number == 4) return('<a href\=\"uploads/publications\/2004_SMTAI_Rogers.pdf\"\>The Effects of Plating Materials, Bond Pad Size, and Bond Pad Geometry on Solder Ball Shear Strength\<\/a\>');
	if (number == 5) return('<a href\=\"uploads/publications\/2001_IEEE_Kinetics_IM_Alloys.pdf\"\>The Kinetics of Formation of Ternary Intermetallic Alloys in Pb-Sn and Cu-Ag-Sn Pb-free Electronic Joints\<\/a\>');
	if (number == 6) return('<a href\=\"uploads/publications\/2004_Plasma_Display_Panel.pdf\"\>Thermal Assessment of Glass-Metal Composition Plasma Display Panels Using Design of Experiments\<\/a\>');
	if (number == 7) return('<a href\=\"uploads/publications\/2002_ThermalCharacteristics_Glass-Metal.pdf\"\>Thermal Characteristics of Glass-Metal Composition Plasma Display Panels\<\/a\>');
	if (number == 8) return('<a href\=\"uploads/publications\/2007_August_CircuiTree.pdf\"\>Using Physics of Failure to Identify Root Cause of Printed Board Failure\<\/a\>');
	if (number == 9) return('<a href\=\"uploads/publications\/2006_Hobbs_PbFree_Article.pdf\"\>What I Don\&rsquo\;t Know That I Don\&rsquo\;t Know: Things to Worry About with the Pb-free Transition\<\/a\>');
	}

// end articles


// B - White Papers (24 = 3 groups of 8):

function whitepapgroup1() {
	var number = rand(8);
	if (number == 1) return('\<a href\=\"uploads/white-papers\/Bromide_Free.pdf\"\>Bromide Free\<\/a\>');
	if (number == 2) return('\<a href\=\"uploads/white-papers\/Reliability_Problems-OptoElectronic_Packaging.pdf\"\>Common Reliability Problems in Opto-Electronic Packaging, Epoxies\<\/a\>');
	if (number == 3) return('\<a href\=\"uploads/white-papers\/Derating_Schottky_Diodes.pdf\"\>Derating of Schottky Diodes\<\/a\>');
	if (number == 4) return('\<a href\=\"uploads/white-papers\/Failure_Mechanisms_in_High_Voltage_PCBs.pdf\"\>Failure Mechanisms in High Voltage PCBs\<\/a\>');
	if (number == 5) return('\<a href\=\"uploads/white-papers\/Five_Myths_of_Reliability.pdf\"\>Five Myths of Reliability\<\/a\>');
	if (number == 6) return('\<a href\=\"uploads/white-papers\/Hollow_Fiber_Measurement_Technique.pdf\"\>Hollow Fiber Measurement Technique\<\/a\>');
	if (number == 7) return('\<a href\=\"uploads/white-papers\/Know_Your_Environment.pdf\"\>Know Your Environment\<\/a\>');
	if (number == 8) return('\<a href\=\"uploads/white-papers\/LED_Failures.pdf\"\>LED Failures\<\/a\>');
	}

function whitepapgroup2() {
	var number = rand(8);
	if (number == 1) return('\<a href\=\"uploads/white-papers\/NEBS_Requirements_for_Pb-free.pdf\"\>NEBS Requirements for Pb-free Electronics\<\/a\>');
	if (number == 2) return('\<a href\=\"uploads/white-papers\/Moisture_Hermetic_Packages.pdf\"\>Moisture in Hermetic Packages\<\/a\>');
	if (number == 3) return('\<a href\=\"uploads/white-papers\/NEBS_Requirements_for_Pb-free.pdf\"\>NEBS Requirements for Pb-free Electronics\<\/a\>');
	if (number == 4) return('\<a href\=\"uploads/white-papers\/Qualifying_Moisture_Containing_Env.pdf\"\>Qualifying for Moisture Containing Environments\<\/a\>');
	if (number == 5) return('\<a href\=\"uploads/white-papers\/Rapid_Strength_Assessment_AMLCDs.pdf\"\>Rapid Strength Assessment Technique for AMLCDs\<\/a\>');
	if (number == 6) return('\<a href\=\"uploads/white-papers\/Red_Phosphorus_Failures_Encap_Circuits.pdf\"\>Red Phosphorus-Induced Failures in Encapsulated Circuits\<\/a\>');
	if (number == 7) return('\<a href\=\"uploads/white-papers\/Time-to-Failure_Metallic_Migration.pdf\"\>Review of Models for Time-to-Failure Due to Metallic Migration Mechanisms\<\/a\>');
	if (number == 8) return('\<a href\=\"uploads/white-papers\/RoHS_Exemptions.pdf\"\>RoHS Exemptions\<\/a\>');
	}

function whitepapgroup3() {
	var number = rand(8);
	if (number == 1) return('\<a href\=\"uploads/white-papers\/Temp_Dependence_Electrical_Overstress.pdf\"\>Temperature Dependence of Electrical Overstress\<\/a\>');
	if (number == 2) return('\<a href\=\"uploads/white-papers\/The_Tin_Myth.pdf\"\>The Tin Myth\<\/a\>');
	if (number == 3) return('\<a href\=\"uploads/white-papers\/Top_5_EMCDos_and_Donts.pdf\"\>Top 5 EMC Do\&rsquo\;s\&nbsp\;\&amp\; Don\&rsquo\;ts\<\/a\>');
	if (number == 4) return('\<a href\=\"uploads/white-papers\/Uprating_Ceramic_Capacitors.pdf\"\>Uprating of Ceramic Capacitors\<\/a\>');
	if (number == 5) return('\<a href\=\"uploads/white-papers\/Uprating_Crystal_Oscillators.pdf\"\>Uprating of Crystal Oscillators\<\/a\>');
	if (number == 6) return('\<a href\=\"uploads/white-papers\/Uprating_of_Electrolytic_Capacitors.pdf\"\>Uprating of Electrolytic Capacitors\<\/a\>');
	if (number == 7) return('\<a href\=\"uploads/white-papers\/Vehicle_Prognostics_Optimized_Maintenance.pdf\"\>Vehicle Prognostics to Enable Optimized Maintenance and Logistics\<\/a\>');
	if (number == 8) return('\<a href\=\"uploads/white-papers\/Why_HALT_Is_Not_HALT.pdf\"\>Why HALT Is Not HALT\<\/a\>');
	}

// end white papers


// C - Case Studies (6 = 1 group of 6):

function casestudgroup1() {
	var number = rand(6);
	if (number == 1) return('\<a href\=\"uploads/case-studies\/Supplier_Intervention_Flex_Circuit.pdf\"\>Flex Circuit Supplier Intervention\<\/a\>');
	if (number == 2) return('\<a href\=\"uploads/case-studies\/identification_of_bga_failure2.pdf\"\>Identification of BGA Failure\<\/a\>');
	if (number == 3) return('\<a href\=\"uploads/case-studies\/Projection_Lamp_Failure_Case_Study.pdf\"\>Projection Lamp Failure Analysis\<\/a\>');
	if (number == 4) return('\<a href\=\"uploads/case-studies\/ESD_Survey_for_Telecommunications.pdf\"\>Telecommunications ESD Audit\<\/a\>');
	if (number == 5) return('\<a href\=\"uploads/case-studies\/tin_whiskers_assessment2.pdf\"\>Tin Whiskers Assessment\<\/a\>');
	if (number == 6) return('\<a href\=\"uploads/case-studies\/prognostics_presentation2.pdf\"\>Vehicle Prognostics\<\/a\>');
	}

// end case studies

// end to-be-randomized lists
