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Temperature Cycling and Fatigue in Electronics

Posted by Gilad Sharon, PhD. on Aug 12, 2016 6:28:55 PM

The majority of electronic failures occur due to thermally induced stresses and strains caused by excessive differences in coefficients of thermal expansion (CTE) across materials.

CTE mismatches occur in both 1st and 2nd level interconnects in electronics assemblies. 1st level interconnects connect the die to a substrate. This substrate can be underfilled so there are both global and local CTE mismatches to consider. 2nd level interconnects connect the substrate, or package, to the printed circuitboard (PCB).This would be considered a “boardlevel” CTE mismatch.Severa lstress and strain mitigation techniques exist including the use of conformal coating.


Topics: temperature cycling, Thermal Cycling, Fatigue, reliability, solder joint reliability

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