College Park, MD – April 24, 2012 – DfR Solutions, a leader in quality, reliability, and durability (QRD) solutions for the electronics industry, today announced the new V2.4 release of its Automated Design AnalysisTM software, Sherlock. Sherlock is the first-of-its-kind Automated Design Analysis software for analyzing, grading, and certifying the expected reliability of products at the circuit card assembly level.
College Park, MD – October 17, 2011 – DfR Solutions, a leader in quality, reliability, and durability (QRD) solutions for the electronics industry, today announced that it had been awarded a 2011 New Product Introduction Award for printed circuit board design by Printed Circuit Design & Fab Magazine. The award was given to Sherlock Automated Design Analysis™ in the category of Design Verification Tools.
College Park, MD – (April 1, 2011) – DfR Solutions, a leading provider of quality, reliability, and durability (QRD) research and consulting for the electronics industry, today announced the launch of Sherlock, the first-of-its-kind Automated Design Analysis software for analyzing, grading, and certifying the expected reliability of products at the circuit card assembly level. The software’s intuitive commands and ease of use enable usage among a broad range of engineers and managers, where rapid results provide almost immediate feedback on product designs and their performance in the hands of the customer.
College Park, MD – November 10, 2008 – DfR Solutions is very proud to announce that Craig Hillman, CEO & Managing Partner, will be at Technology World 2008, on November 18th in Coventry, England. Dr. Hillman will be presenting “Common DfR Mistakes by Systems Designers,” as part of ‘Technology Breakthroughs – Bending the Design Rules!” Dr. Hillman will review the most common electrical, mechanical, and material mistakes that system designers make when designing circuit card assemblies for current and next generation products.
College Park, MD – (January 3, 2007) — Dr. Craig Hillman, an expert on strategic reliability solutions, failure analysis and lead free technology, will be the special guest speaker at MET Labs’ North American Regulatory Conference for Electronics Products, January 23 & 24, 2007. The conference will take place at the Novotel Bauhenia Shenzen in Shenzen, China.
