In the early stages of product development, effective design-for-reliability (DFR) approaches can have critical impact to the final product integrity. DFR’s goal is to assure adequate product strength against lifecycle stresses proactively. At the component level, identifying and controlling critical reliability factors can take place in schematics and prototype stage (as well as later) and component derating is one popular DFR approach for assuring that individual component will be able to operate robustly against major stress elements.
Component derating is the practice of reducing stresses on electronic components to improve the end product reliability. There have been a number of derating standards established by government and industry bodies. Examples include Air Force AFSC Pamphlet 800-27, MIL-HDBK-1547, NAVSEA SD-18, NASA Johnson Space Center SSP 30312, NASA Goddard MSFC-3012, NASA Jet Propulsion Lab JPL-D-8545, Boeing MF0004-400 and RIAC Quanterion. Thesederating approaches will mostly improve product robustness when properly implemented. However, there are improvement and upgrading opportunities as discussed below.